Inertial MEMS test and characterization systems: Optimized for the testing and characterization of inertial MEMS, such as accelerometers, M/SteP-I incorporates a suite of high precision instruments tailored to inertial testing applications. All the resources necessary to interface to electrodynamic shakers, thermal chambers, and material handlers are included. An Inertial Stimulus Package includes the shaker I/O for interfacing to the electrodynamic shaker and the reference accelerometer.